AI RESEARCH
Multi-Period Texture Contrast Enhancement for Low-Contrast Wafer Defect Detection and Segmentation
arXiv CS.CV
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ArXi:2603.14282v1 Announce Type: new Wafer defect segmentation is pivotal for semiconductor yield optimization yet remains challenged by the intrinsic conflict between microscale anomalies and highly periodic, overwhelming background textures. Existing deep learning paradigms often falter due to feature dilution during downsampling and the lack of explicit mechanisms to disentangle low-contrast defects from process-induced noise.