AI RESEARCH
From Artefact to Insight: Efficient Low-Rank Adaptation of BrushNet for Scanning Probe Microscopy Image Restoration
arXiv CS.CV
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ArXi:2603.14850v1 Announce Type: new Scanning Probe Microscopy or SPM offers nanoscale resolution but is frequently marred by structured artefacts such as line scan dropout, gain induced noise, tip convolution, and phase hops. While most available methods treat SPM artefact removal as isolated denoising or interpolation tasks, the generative inpainting perspective remains largely unexplored. In this work, we