Bridging the Simulation-to-Reality Gap in Electron Microscope Calibration via VAE-EM Estimation

ArXi:2603.16549v1 Announce Type: cross Electron microscopy has enabled many scientific breakthroughs across multiple fields. A key challenge is the tuning of microscope parameters based on images to overcome optical aberrations that deteriorate image quality. This calibration problem is challenging due to the high-dimensional and noisy nature of the diagnostic images, and the fact that optimal parameters cannot be identified from a single image.