AI RESEARCH
AI-assisted Human-in-the-Loop Web Platform for Structural Characterization in Hard drive design
arXiv CS.CV
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ArXi:2604.00359v1 Announce Type: cross Scanning transmission electron microscopy (STEM) has become a cornerstone instrument for semiconductor materials metrology, enabling nanoscale analysis of complex multilayer structures that define device performance. Developing effective metrology workflows for such systems requires balancing automation with flexibility; rigid pipelines are brittle to sample variability, while purely manual approaches are slow and subjective.