AI RESEARCH
3D Gaussian Splatting for Annular Dark Field Scanning Transmission Electron Microscopy Tomography Reconstruction
arXiv CS.CV
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ArXi:2604.04693v1 Announce Type: new Analytical Dark Field Scanning Transmission Electron Microscopy (ADF-STEM) tomography reconstructs nanoscale materials in 3D by integrating multi-view tilt-series images, enabling precise analysis of their structural and compositional features. Although integrating tilt views improves 3D reconstruction, it requires extended electron exposure that risks damaging dose-sensitive materials and