AI RESEARCH
A Mixture of Experts Foundation Model for Scanning Electron Microscopy Image Analysis
arXiv CS.LG
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ArXi:2604.05960v1 Announce Type: new Scanning Electron Microscopy (SEM) is indispensable in modern materials science, enabling high-resolution imaging across a wide range of structural, chemical, and functional investigations. However, SEM imaging remains constrained by task-specific models and labor-intensive acquisition processes that limit its scalability across diverse applications. Here, we