Industrial Surface Defect Detection via Diffusion Generation and Asymmetric Student-Teacher Network

ArXi:2604.19240v1 Announce Type: new Industrial surface defect detection often suffers from limited defect samples, severe long-tailed distributions, and difficulties in accurately localizing subtle defects under complex backgrounds. To address these challenges, this paper proposes an unsupervised defect detection method that integrates a Denoising Diffusion Probabilistic Model (DDPM) with an asymmetric teacher-student architecture. First, at the data level, the DDPM is trained solely on normal samples.