Automated Annotation of Shearographic Measurements Enabling Weakly Supervised Defect Detection

ArXi:2512.06171v2 Announce Type: replace Shearography is an interferometric technique sensitive to surface displacement gradients, providing high sensitivity for detecting subsurface defects in safety-critical components. A key limitation to industrial adoption is the lack of high-quality annotated datasets, since manual labeling remains labor-intensive, subjective, and difficult to standardize. We present an automated labeling pipeline that generates candidate defect bounding boxes with Grounded DINO, refines them using SAM masks, and exports YOLO-format labels for downstream detector.