AI RESEARCH
Mean Testing under Truncation beyond Gaussian
arXiv CS.LG
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ArXi:2605.01335v1 Announce Type: cross We characterize the fundamental limits of high-dimensional mean testing under arbitrary truncation, where samples are drawn from the conditional distribution $P(\cdot \mid S)$ for an unknown truncation set $S$ that may hide up to an $\varepsilon$-fraction of the probability mass. For distributions with $p$-th directional moments of magnitude at most $\nu_{P,p}$, truncation induces a bias of order $O(\nu_{P,p}\varepsilon^{1-1/p