ExDD: Explicit Dual Distribution Learning for Surface Defect Detection via Diffusion Synthesis

ArXi:2507.15335v2 Announce Type: replace-cross Industrial defect detection systems face critical limitations when confined to one-class anomaly detection paradigms, which assume uniform outlier distributions and struggle with data scarcity in real-world manufacturing environments. We present ExDD (Explicit Dual Distribution), a novel framework that transcends these limitations by explicitly modeling dual feature distributions.